Whole field out-of-plane vibration analysis with a HOE-based ESPI system

Emilia Mihaylova, Viswanath Bavigadda, Raghavendra Jallapuram, Vincent Toal

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    Electronic speckle pattern interferometry (ESPI) is a full-field measurement technique, capable of displaying vibrational mode shapes. A simple optical set-up for an ESPI system using a holographic optical element (HOE) is presented. The HOE is designed to create a speckled reference beam in the interferometer. A partially reflective glass plate provides illumination of the object along the normal to its surface, ensuring that the system is sensitive only to out-of-plane displacement of the object. It is demonstrated that the HOE-based system can be used for vibration measurements. Phase shifting can be implemented for fringe analysis. A big advantage of the system is its simplicity. It requires a small number of components: a coherent light source, a holographic optical element, a glass plate and a CCD camera. Introducing holographic optical elements in ESPI gives the advantage of large aperture optical elements at relatively low cost.

    Original languageEnglish
    Title of host publicationEighth International Conference on Vibration Measurements by Laser Techniques
    Subtitle of host publicationAdvances and Applications
    DOIs
    Publication statusPublished - 2008
    Event8th International Conference on Vibration Measurements by Laser Techniques: Advances and Applications - Ancona, Italy
    Duration: 18 Jun 200820 Jun 2008

    Publication series

    NameProceedings of SPIE - The International Society for Optical Engineering
    Volume7098
    ISSN (Print)0277-786X

    Conference

    Conference8th International Conference on Vibration Measurements by Laser Techniques: Advances and Applications
    Country/TerritoryItaly
    CityAncona
    Period18/06/0820/06/08

    Keywords

    • ESPI
    • HOE
    • Holographic optical elements
    • Interferometry
    • Mode analysis
    • Vibrations

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