White light interferometric surface profiler

    Research output: Contribution to journalArticlepeer-review

    Abstract

    We describe an optical system for 3-D profilometry based on the white light interferometer. Recently many different methods have been used to analyze the data obtained from white light interferometric profilers. Many commercially available white light profilers are also in use today. We detail a simple way to construct a profiler that uses two simple and efficient algorithms. It deals with the data in a fast and simple manner, thus reducing both the acquisition and analysis time. The system has a theoretically unlimited range and can profile both optically rough and Smooth surfaces.

    Original languageEnglish
    Pages (from-to)1796-1799
    Number of pages4
    JournalOptical Engineering
    Volume37
    Issue number6
    DOIs
    Publication statusPublished - Jun 1998

    Keywords

    • Coherence region
    • Profilometry
    • White light interferometry

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