Abstract
Application of the principles developed in Part I [Electrochim. Acta 30, 89 (1985)] of this series leads to the development of simple thin layer geometries that used to obtain quantitative voltammetric and coulometric data on systems of high specific resistivity. The advantages of using these techniques are discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 95-99 |
| Number of pages | 5 |
| Journal | Electrochimica Acta |
| Volume | 30 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - Jan 1985 |
| Externally published | Yes |
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