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Using Machine Learning to Identify Patterns in Learner-Submitted Code for the Purpose of Assessment

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Programming has become an important skill in today’s world and is taught widely both in traditional and online settings. Instructors need to grade increasing amounts of student work. Unit testing can contribute to the automation of the grading process but it cannot assess the structure or partial correctness of code, which is needed for finely differentiated grading. This paper builds on previous research that investigated machine learning models for determining the correctness of programs from token-based features of source code and found that some such models can be successful in classifying source code with respect to whether it passes unit tests. This paper makes two further contributions. First, these results are scrutinized under conditions of varying similarity between code instances used for model training and testing, for a better understanding of how well the models generalize. It was found that the models do not generalize outside of groups of code instances performing very similar tasks (corresponding to similar coding assignments). Second, selected binary classification models are used as a base for multi-class prediction with two different methods. Both of these exhibit prediction success well above the random baseline, with potential to contribute to automated assessment with multi-valued measures of quality (grading schemes), in contrast to the binary pass/fail measure associated with unit testing.

Original languageEnglish
Title of host publicationPattern Recognition - 15th Mexican Conference, MCPR 2023, Proceedings
EditorsAnsel Yoan Rodríguez-González, Humberto Pérez-Espinosa, José Francisco Martínez-Trinidad, Jesús Ariel Carrasco-Ochoa, José Arturo Olvera-López
PublisherSpringer Science and Business Media Deutschland GmbH
Pages47-57
Number of pages11
ISBN (Print)9783031337826
DOIs
Publication statusPublished - 2023
Event15th Mexican Conference on Pattern Recognition, MCPR 2023 - Tepic, Mexico
Duration: 21 Jun 202324 Jun 2023

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume13902 LNCS
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Conference15th Mexican Conference on Pattern Recognition, MCPR 2023
Country/TerritoryMexico
CityTepic
Period21/06/2324/06/23

Keywords

  • Applied Machine Learning for Code Assessment
  • Automated Grading
  • Student Programming Code Grading

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