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Study of the de Vries phase in new organosiloxanes by electrooptical and UV/V is spectroscopy measurements

  • Yu P. Panarin
  • , F. Antonelli
  • , O. E. Panarina
  • , Yu Semenova
  • , J. K. Vij
  • , M. Reihmann
  • , G. Galli

    Research output: Contribution to journalConference articlepeer-review

    Abstract

    The properties and structure of de Vries materials in new series of organosiloxane liquid crystalline materials has been studied using electrooptical measurements and UV/V is spectroscopy. The compounds from this series show different strength of the de Vries phase. Two independent parameters to characterize de Vries properties were introduced. The structure-properties relations of these materials were studied.

    Original languageEnglish
    Pages (from-to)[255]/111-[260]/116
    JournalFerroelectrics
    Volume309-312
    DOIs
    Publication statusPublished - 2004
    Event9th International Conference on Ferroelectric Liquid Crystals, FLC 2003 - Dublin, Ireland
    Duration: 24 Aug 200329 Aug 2003

    Keywords

    • Birefringence
    • Critical behavior
    • De Vries smectic
    • Electroclinic
    • Organosiloxane

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