Abstract
The properties and structure of de Vries materials in new series of organosiloxane liquid crystalline materials has been studied using electrooptical measurements and UV/V is spectroscopy. The compounds from this series show different strength of the de Vries phase. Two independent parameters to characterize de Vries properties were introduced. The structure-properties relations of these materials were studied.
| Original language | English |
|---|---|
| Pages (from-to) | [255]/111-[260]/116 |
| Journal | Ferroelectrics |
| Volume | 309-312 |
| DOIs | |
| Publication status | Published - 2004 |
| Event | 9th International Conference on Ferroelectric Liquid Crystals, FLC 2003 - Dublin, Ireland Duration: 24 Aug 2003 → 29 Aug 2003 |
Keywords
- Birefringence
- Critical behavior
- De Vries smectic
- Electroclinic
- Organosiloxane
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