Abstract
This paper experimentally demonstrates a method for geometrical profiling of asymmetries in fabricated thin microfiber tapers with waist diameters ranging from ∼10 to ∼50 µm with submicron accuracy. The method is based on the analysis of whispering gallery mode resonances excited in cylindrical fiber resonators as a result of evanescent coupling of light propagating through the fiber taper. The submicron accuracy of the proposed method has been verified by SEM studies. The method can be applied as a quality control tool in fabrication of microfiber based devices and sensors or for fine-tuning of microfiber fabrication set-ups.
| Original language | English |
|---|---|
| Pages (from-to) | 82-88 |
| Number of pages | 7 |
| Journal | Optical Fiber Technology |
| Volume | 41 |
| DOIs | |
| Publication status | Published - Mar 2018 |
Keywords
- Fiber characterization
- Fiber optics sensors
- Fiber properties
- Fibers
- Microcavity devices
- Microstructured optical fibers
- Resonators
- Surface waves