Some aspects of process control in semiconductor manufacturing

Keelin Relihan, Shane Geraghty, Aidan O'Dwyer

Research output: Contribution to conferencePaperpeer-review

Abstract

This paper outlines some aspects of process control in semiconductor manufacturing. Starting with an outline of the semiconductor manufacturing process, the contribution will discuss temperature control of the chemical vapour deposition stage and the control of the wafer etching process, based on the industrial experience of the first two authors. Subsequently, the authors draw the attention of the semiconductor manufacturing community to the potential of properly tuned PID controllers for the achievement of simple and high performance control solutions.
Original languageEnglish
DOIs
Publication statusPublished - 2007
Event24th International Manufacturing Conference - Waterford, Ireland
Duration: 1 Aug 200731 Aug 2007

Conference

Conference24th International Manufacturing Conference
Country/TerritoryIreland
CityWaterford
Period1/08/0731/08/07

Keywords

  • process control
  • semiconductor manufacturing
  • temperature control
  • chemical vapour deposition
  • wafer etching
  • PID controllers

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