Simulation of edge effects in electroanalytical experiments by orthogonal collocation-VI. Cyclic voltammetry at ultramicroelectrode ensembles

John Cassidy; Jamal Ghoroghchian; Feresteh Sarfarazi; Jerry J. Smith; Stanley Pons

doi:10.1016/0013-4686(86)87029-3

Simulation of edge effects in electroanalytical experiments by orthogonal collocation-VI. Cyclic voltammetry at ultramicroelectrode ensembles

John Cassidy, Jamal Ghoroghchian, Feresteh Sarfarazi, Jerry J. Smith, Stanley Pons

Research output: Contribution to journal › Article › peer-review

Abstract

Orthogonal collocation is used to simulate cyclic voltammetry at ensembles of disc ultra-microelectrodes. The effect of slow electron transfer is considered and a model is proposed for Ohmic drop across the face of the electrode.

Original language	English
Pages (from-to)	629-636
Number of pages	8
Journal	Electrochimica Acta
Volume	31
Issue number	6
DOIs	https://doi.org/10.1016/0013-4686(86)87029-3
Publication status	Published - Jun 1986
Externally published	Yes

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@article{2d90e9254e36441ebf47c2b4a8372ab3,

title = "Simulation of edge effects in electroanalytical experiments by orthogonal collocation-VI. Cyclic voltammetry at ultramicroelectrode ensembles",

abstract = "Orthogonal collocation is used to simulate cyclic voltammetry at ensembles of disc ultra-microelectrodes. The effect of slow electron transfer is considered and a model is proposed for Ohmic drop across the face of the electrode.",

author = "John Cassidy and Jamal Ghoroghchian and Feresteh Sarfarazi and Smith, \{Jerry J.\} and Stanley Pons",

year = "1986",

month = jun,

doi = "10.1016/0013-4686(86)87029-3",

language = "English",

volume = "31",

pages = "629--636",

journal = "Electrochimica Acta",

issn = "0013-4686",

publisher = "Elsevier Ltd.",

number = "6",

}

TY - JOUR

T1 - Simulation of edge effects in electroanalytical experiments by orthogonal collocation-VI. Cyclic voltammetry at ultramicroelectrode ensembles

AU - Cassidy, John

AU - Ghoroghchian, Jamal

AU - Sarfarazi, Feresteh

AU - Smith, Jerry J.

AU - Pons, Stanley

PY - 1986/6

Y1 - 1986/6

N2 - Orthogonal collocation is used to simulate cyclic voltammetry at ensembles of disc ultra-microelectrodes. The effect of slow electron transfer is considered and a model is proposed for Ohmic drop across the face of the electrode.

AB - Orthogonal collocation is used to simulate cyclic voltammetry at ensembles of disc ultra-microelectrodes. The effect of slow electron transfer is considered and a model is proposed for Ohmic drop across the face of the electrode.

UR - https://www.scopus.com/pages/publications/0022737424

U2 - 10.1016/0013-4686(86)87029-3

DO - 10.1016/0013-4686(86)87029-3

M3 - Article

AN - SCOPUS:0022737424

SN - 0013-4686

VL - 31

SP - 629

EP - 636

JO - Electrochimica Acta

JF - Electrochimica Acta

IS - 6

ER -

Simulation of edge effects in electroanalytical experiments by orthogonal collocation-VI. Cyclic voltammetry at ultramicroelectrode ensembles

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