Skip to main navigation Skip to search Skip to main content

Simulation of edge effects in electroanalytical experiments by orthogonal collocation-VI. Cyclic voltammetry at ultramicroelectrode ensembles

  • John Cassidy
  • , Jamal Ghoroghchian
  • , Feresteh Sarfarazi
  • , Jerry J. Smith
  • , Stanley Pons

Research output: Contribution to journalArticlepeer-review

Abstract

Orthogonal collocation is used to simulate cyclic voltammetry at ensembles of disc ultra-microelectrodes. The effect of slow electron transfer is considered and a model is proposed for Ohmic drop across the face of the electrode.

Original languageEnglish
Pages (from-to)629-636
Number of pages8
JournalElectrochimica Acta
Volume31
Issue number6
DOIs
Publication statusPublished - Jun 1986
Externally publishedYes

Fingerprint

Dive into the research topics of 'Simulation of edge effects in electroanalytical experiments by orthogonal collocation-VI. Cyclic voltammetry at ultramicroelectrode ensembles'. Together they form a unique fingerprint.

Cite this