Simulation of edge effects in electroanalytical experiments by orthogonal collocation-VI. Cyclic voltammetry at ultramicroelectrode ensembles

John Cassidy, Jamal Ghoroghchian, Feresteh Sarfarazi, Jerry J. Smith, Stanley Pons

Research output: Contribution to journalArticlepeer-review

Abstract

Orthogonal collocation is used to simulate cyclic voltammetry at ensembles of disc ultra-microelectrodes. The effect of slow electron transfer is considered and a model is proposed for Ohmic drop across the face of the electrode.

Original languageEnglish
Pages (from-to)629-636
Number of pages8
JournalElectrochimica Acta
Volume31
Issue number6
DOIs
Publication statusPublished - Jun 1986
Externally publishedYes

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