Simple shearing interferometer suitable for vibration measurements

Emilia Mihaylova, Maurice Whelan, Vincent Toal

Research output: Contribution to journalConference articlepeer-review

Abstract

Recently there has been an increasing interest in the application of shearography for modal analysis of vibrating objects. New interferometric systems, which are simple and flexible are of interest for engineering and industrial applications. An electronic speckle pattern shearing interferometer (ESPSI) with a very simple shearing device is used for study of vibrations. The shearing device consists of two partially reflective glass plates. The reflection coefficients of the coatings are 0.3 and 0.7 respectively. The distance between the two glass plates controls the size of the shear. The versatility of this simple shearing interferometer is shown. It is demonstrated that the ESPSI system can be used for vibration measurements and phase-shifting implemented for fringe analysis. The results obtained are promising for future applications of the system for modal analysis.

Original languageEnglish
Pages (from-to)85-89
Number of pages5
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5503
DOIs
Publication statusPublished - 2004
EventSixth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications - Ancona, Italy
Duration: 22 Jun 200425 Jun 2004

Keywords

  • ESPSI
  • Mode analysis
  • Shearing interferometry
  • Vibrations

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