SEM and TEM Image Analysis for Morphology and Phase Transition of CZTS, Sb₂Se₃ and Perovskite Thin Films under Thermal Stress

This study utilizes an image processing method to analyse the grain size of perovskite, CZTS kesterite and antimony chalcogenide (Sb₂Se₃) thin films at various temperatures using SEM and TEM images. Empirical equations (exponential, Gaussian, power law) were derived from the data, revealing distinct temperature-dependent trends in grain size. Perovskite films exhibit a Gaussian trend, showing extreme sensitivity to temperature. CZTS films follow a double exponential function, with optimal grain size at 300°C. Sb₂Se₃ films adhere to a power law (~T⁶), with grain size rapidly increasing at higher temperatures. These temperature-dependent behaviours offer insights into optimizing fabrication processes and enhancing the efficiency of these materials in photovoltaic applications.