Non-destructive testing using electronic speckle pattern interferometry

V. Toal; S. Martin; A. Burden; B. Bowe

Non-destructive testing using electronic speckle pattern interferometry

V. Toal
, S. Martin
, A. Burden
, B. Bowe

Research output: Contribution to journal › Article › peer-review

Abstract

At the Centre for Industrial and Engineering Optics a new Electronic Speckle Pattern Interferometry (ESPI) system has been developed for non-destructive testing and strain measurements. The system uses a liquid crystal electro-optical switch to change between the illumination geometries for sensitivity in two orthogonal directions. Two more liquid crystal devices provide phase-shifting for automated analysis and the system is controlled by advanced software. There are no moving parts, which is an advantage in any ESPI system, where mechanical stability is vital.

Original language	English
Pages (from-to)	135-141
Number of pages	7
Journal	Insight: Non-Destructive Testing and Condition Monitoring
Volume	41
Issue number	3
Publication status	Published - Mar 1999

Cite this

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title = "Non-destructive testing using electronic speckle pattern interferometry",

abstract = "At the Centre for Industrial and Engineering Optics a new Electronic Speckle Pattern Interferometry (ESPI) system has been developed for non-destructive testing and strain measurements. The system uses a liquid crystal electro-optical switch to change between the illumination geometries for sensitivity in two orthogonal directions. Two more liquid crystal devices provide phase-shifting for automated analysis and the system is controlled by advanced software. There are no moving parts, which is an advantage in any ESPI system, where mechanical stability is vital.",

author = "V. Toal and S. Martin and A. Burden and B. Bowe",

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language = "English",

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AU - Burden, A.

AU - Bowe, B.

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N2 - At the Centre for Industrial and Engineering Optics a new Electronic Speckle Pattern Interferometry (ESPI) system has been developed for non-destructive testing and strain measurements. The system uses a liquid crystal electro-optical switch to change between the illumination geometries for sensitivity in two orthogonal directions. Two more liquid crystal devices provide phase-shifting for automated analysis and the system is controlled by advanced software. There are no moving parts, which is an advantage in any ESPI system, where mechanical stability is vital.

AB - At the Centre for Industrial and Engineering Optics a new Electronic Speckle Pattern Interferometry (ESPI) system has been developed for non-destructive testing and strain measurements. The system uses a liquid crystal electro-optical switch to change between the illumination geometries for sensitivity in two orthogonal directions. Two more liquid crystal devices provide phase-shifting for automated analysis and the system is controlled by advanced software. There are no moving parts, which is an advantage in any ESPI system, where mechanical stability is vital.

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JF - Insight: Non-Destructive Testing and Condition Monitoring

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Non-destructive testing using electronic speckle pattern interferometry

Abstract

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