Abstract
At the Centre for Industrial and Engineering Optics a new Electronic Speckle Pattern Interferometry (ESPI) system has been developed for non-destructive testing and strain measurements. The system uses a liquid crystal electro-optical switch to change between the illumination geometries for sensitivity in two orthogonal directions. Two more liquid crystal devices provide phase-shifting for automated analysis and the system is controlled by advanced software. There are no moving parts, which is an advantage in any ESPI system, where mechanical stability is vital.
| Original language | English |
|---|---|
| Pages (from-to) | 135-141 |
| Number of pages | 7 |
| Journal | Insight: Non-Destructive Testing and Condition Monitoring |
| Volume | 41 |
| Issue number | 3 |
| Publication status | Published - Mar 1999 |