Nanoscale characterization of β-phase HxLi 1-xNbO3 layers by piezoresponse force microscopy

Michele Manzo, Denise Denning, Brian J. Rodriguez, Katia Gallo

Research output: Contribution to journalArticlepeer-review

Abstract

We investigate a non-destructive approach for the characterization of proton exchanged layers in LiNbO3 with sub-micrometric resolution by means of piezoresponse force microscopy (PFM). Through systematic analyses, we identify a clear correlation between optical measurements on the extraordinary refractive index and PFM measurements on the piezoelectric d33 coefficient. Furthermore, we quantify the reduction of the latter induced by proton exchange as 83 ± 2% and 68 ± 3% of the LiNbO3 value, for undoped and 5 mol. % MgO-doped substrates, respectively.

Original languageEnglish
Article number066815
JournalJournal of Applied Physics
Volume116
Issue number6
DOIs
Publication statusPublished - 14 Aug 2014
Externally publishedYes

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