Investigating the efficacy of algorithmic student modelling in predicting students at risk of failing in tertiary education.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    The increasing numbers enrolling for college courses, and increased diversity in the classroom, poses a challenge for colleges in enabling all students achieve their potential. This paper reports on a study to model factors, using data mining techniques, that are predictive of college academic performance, and can be measured during first year enrolment. Data was gathered over three years, and focused on a diverse student population of first year students from a range of academic disciplines (n≈1100). Initial models generated on two years of data (n=713) demonstrate high accuracy. Advice is sought on additional analysis approaches to consider.

    Original languageEnglish
    Title of host publicationProceedings of the 6th International Conference on Educational Data Mining, EDM 2013
    EditorsSidney K. D'Mello, Rafael A. Calvo, Andrew Olney
    PublisherInternational Educational Data Mining Society
    ISBN (Electronic)9780983952527
    Publication statusPublished - 2013
    Event6th International Conference on Educational Data Mining, EDM 2013 - Memphis, United States
    Duration: 6 Jul 20139 Jul 2013

    Publication series

    NameProceedings of the 6th International Conference on Educational Data Mining, EDM 2013

    Conference

    Conference6th International Conference on Educational Data Mining, EDM 2013
    Country/TerritoryUnited States
    CityMemphis
    Period6/07/139/07/13

    Keywords

    • Academic performance
    • Educational data mining
    • Motivation
    • Personality
    • Self-regulation
    • Specific learning difficulties

    Fingerprint

    Dive into the research topics of 'Investigating the efficacy of algorithmic student modelling in predicting students at risk of failing in tertiary education.'. Together they form a unique fingerprint.

    Cite this