Discontinuous change in the smectic layer thickness in ferrielectric liquid crystals

V. P. Panov; J. K. Vij; Yu P. Panarin; C. Blanc; V. Lorman; J. W. Goodby

doi:10.1103/PhysRevE.75.042701

Discontinuous change in the smectic layer thickness in ferrielectric liquid crystals

V. P. Panov
, J. K. Vij
, Yu P. Panarin
, C. Blanc
, V. Lorman
, J. W. Goodby

Research output: Contribution to journal › Article › peer-review

Abstract

The temperature dependence of the thickness of thick free-standing films is studied using a high-resolution film thickness measurement technique. A small discontinuity in the temperature dependence of the smectic layer thickness at every phase transition between ferro-, ferri-, and antiferroelectric phases is observed. We show that the major contribution to it arises from a change in the smectic tilt angle.

Original language	English
Article number	042701
Journal	Physical Review E - Statistical, Nonlinear, and Soft Matter Physics
Volume	75
Issue number	4
DOIs	https://doi.org/10.1103/PhysRevE.75.042701
Publication status	Published - 9 Apr 2007

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title = "Discontinuous change in the smectic layer thickness in ferrielectric liquid crystals",

abstract = "The temperature dependence of the thickness of thick free-standing films is studied using a high-resolution film thickness measurement technique. A small discontinuity in the temperature dependence of the smectic layer thickness at every phase transition between ferro-, ferri-, and antiferroelectric phases is observed. We show that the major contribution to it arises from a change in the smectic tilt angle.",

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AU - Panov, V. P.

AU - Vij, J. K.

AU - Panarin, Yu P.

AU - Blanc, C.

AU - Lorman, V.

AU - Goodby, J. W.

PY - 2007/4/9

Y1 - 2007/4/9

N2 - The temperature dependence of the thickness of thick free-standing films is studied using a high-resolution film thickness measurement technique. A small discontinuity in the temperature dependence of the smectic layer thickness at every phase transition between ferro-, ferri-, and antiferroelectric phases is observed. We show that the major contribution to it arises from a change in the smectic tilt angle.

AB - The temperature dependence of the thickness of thick free-standing films is studied using a high-resolution film thickness measurement technique. A small discontinuity in the temperature dependence of the smectic layer thickness at every phase transition between ferro-, ferri-, and antiferroelectric phases is observed. We show that the major contribution to it arises from a change in the smectic tilt angle.

UR - https://www.scopus.com/pages/publications/34147176493

U2 - 10.1103/PhysRevE.75.042701

DO - 10.1103/PhysRevE.75.042701

M3 - Article

SN - 1539-3755

VL - 75

JO - Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

JF - Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

IS - 4

M1 - 042701

ER -

Discontinuous change in the smectic layer thickness in ferrielectric liquid crystals

Abstract

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