Direct measurement of a high-speed (>100Gbit/s) OTDM data signal utilising two-photon absorption in a semiconductor microcavity

P. J. Maguire; L. P. Barry; T. Krug; J. O'Dowd; M. Lynch; A. L. Bradley; J. F. Donegan; H. Folliot

doi:10.1109/LEOS.2005.1547910

Direct measurement of a high-speed (>100Gbit/s) OTDM data signal utilising two-photon absorption in a semiconductor microcavity

P. J. Maguire, L. P. Barry, T. Krug, J. O'Dowd, M. Lynch, A. L. Bradley, J. F. Donegan, H. Folliot

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	18th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS 2005
Pages	125-126
Number of pages	2
DOIs	https://doi.org/10.1109/LEOS.2005.1547910
Publication status	Published - 2005
Externally published	Yes
Event	18th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS 2005 - Sydney, Australia Duration: 22 Oct 2005 → 28 Oct 2005

Publication series

Name	Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume	2005
ISSN (Print)	1092-8081

Conference

Conference	18th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS 2005
Country/Territory	Australia
City	Sydney
Period	22/10/05 → 28/10/05

Access to Document

10.1109/LEOS.2005.1547910

Cite this

Maguire, P. J., Barry, L. P., Krug, T., O'Dowd, J., Lynch, M., Bradley, A. L., Donegan, J. F., & Folliot, H. (2005). Direct measurement of a high-speed (>100Gbit/s) OTDM data signal utilising two-photon absorption in a semiconductor microcavity. In 18th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS 2005 (pp. 125-126). Article 1547910 (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS; Vol. 2005). https://doi.org/10.1109/LEOS.2005.1547910

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title = "Direct measurement of a high-speed (>100Gbit/s) OTDM data signal utilising two-photon absorption in a semiconductor microcavity",

author = "Maguire, {P. J.} and Barry, {L. P.} and T. Krug and J. O'Dowd and M. Lynch and Bradley, {A. L.} and Donegan, {J. F.} and H. Folliot",

year = "2005",

doi = "10.1109/LEOS.2005.1547910",

language = "English",

isbn = "0780392175",

series = "Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS",

pages = "125--126",

booktitle = "18th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS 2005",

note = "18th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS 2005 ; Conference date: 22-10-2005 Through 28-10-2005",

}

Maguire, PJ, Barry, LP, Krug, T, O'Dowd, J, Lynch, M, Bradley, AL, Donegan, JF & Folliot, H 2005, Direct measurement of a high-speed (>100Gbit/s) OTDM data signal utilising two-photon absorption in a semiconductor microcavity. in 18th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS 2005., 1547910, Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS, vol. 2005, pp. 125-126, 18th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS 2005, Sydney, Australia, 22/10/05. https://doi.org/10.1109/LEOS.2005.1547910

Direct measurement of a high-speed (>100Gbit/s) OTDM data signal utilising two-photon absorption in a semiconductor microcavity. / Maguire, P. J.; Barry, L. P.; Krug, T. et al.
18th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS 2005. 2005. p. 125-126 1547910 (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS; Vol. 2005).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Barry, L. P.

AU - Krug, T.

AU - O'Dowd, J.

AU - Lynch, M.

AU - Bradley, A. L.

AU - Donegan, J. F.

AU - Folliot, H.

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T3 - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

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BT - 18th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS 2005

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Maguire PJ, Barry LP, Krug T, O'Dowd J, Lynch M, Bradley AL et al. Direct measurement of a high-speed (>100Gbit/s) OTDM data signal utilising two-photon absorption in a semiconductor microcavity. In 18th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS 2005. 2005. p. 125-126. 1547910. (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS). doi: 10.1109/LEOS.2005.1547910