TY - JOUR
T1 - Diagnostics of an O2-He RF atmospheric plasma discharge by spectral emission
AU - Milosavljević, Vladimir
AU - Donegan, Mick
AU - Cullen, Patrick J.
AU - Dowling, Denis P.
PY - 2014/1/15
Y1 - 2014/1/15
N2 - In this paper optical emission spectroscopy (OES) is used as a Diagnostic technique for the measurement of atomic and molecular spectral emissions generated using a helium rf industrial atmospheric plasma jet system. The OES of neutral atomic spectral lines and molecular bands are investigated over a range of plasma process parameters. Wavelength resolve optical emission profiles suggest that the emission of helium's spectral lines shows that the high energy electrons have a larger influence than helium metastables on the overall spectral emission. Furthermore, the experimental data indicates that the use of high helium flow rates, in any confined open air plasma discharge, limits the significance of air impurities, e.g., nitrogen, for the creation and sustainability of plasma discharges in helium-oxygen gas chemistry.
AB - In this paper optical emission spectroscopy (OES) is used as a Diagnostic technique for the measurement of atomic and molecular spectral emissions generated using a helium rf industrial atmospheric plasma jet system. The OES of neutral atomic spectral lines and molecular bands are investigated over a range of plasma process parameters. Wavelength resolve optical emission profiles suggest that the emission of helium's spectral lines shows that the high energy electrons have a larger influence than helium metastables on the overall spectral emission. Furthermore, the experimental data indicates that the use of high helium flow rates, in any confined open air plasma discharge, limits the significance of air impurities, e.g., nitrogen, for the creation and sustainability of plasma discharges in helium-oxygen gas chemistry.
UR - https://www.scopus.com/pages/publications/84897804996
U2 - 10.7566/JPSJ.83.014501
DO - 10.7566/JPSJ.83.014501
M3 - Article
AN - SCOPUS:84897804996
SN - 0031-9015
VL - 83
JO - Journal of the Physical Society of Japan
JF - Journal of the Physical Society of Japan
IS - 1
M1 - 014501
ER -