Detection of cracks and defects using electronic speckle pattern interferometry with a holographic optical element

Emilia Mihaylova; Vincent Toal; Sridhar Guntaka; Suzanne Martin

doi:10.1117/12.519489

Detection of cracks and defects using electronic speckle pattern interferometry with a holographic optical element

Emilia Mihaylova, Vincent Toal, Sridhar Guntaka, Suzanne Martin

Research output: Contribution to journal › Conference article › peer-review

Abstract

An electronic speckle pattern interferometry (ESPI) system for detection of cracks and defects is presented. In the first stage a holographic optical element (HOE) is recorded using a photopolymer material. Since the polymerisation process occurs during recording, the holograms are produced without any development/processing. In the second stage the HOE is used in an ESPI configuration for detection of cracks and defects. Due to the introduction of the HOE in the ESPI set-up, precise alignment of the optical elements is not necessary. For this reason the system is well suited for industrial applications.

Original language	English
Pages (from-to)	209-213
Number of pages	5
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	5226
DOIs	https://doi.org/10.1117/12.519489
Publication status	Published - 2003
Event	12th International School on Quantum Electronics Laser Physics and Applications - Varna, Bulgaria Duration: 23 Sep 2002 → 27 Sep 2002

Keywords

Cracks
Defects
ESPI
Electronic speckle pattern interferometry
HOE
Holographic optical element
NDT
Photopolymer

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10.1117/12.519489

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title = "Detection of cracks and defects using electronic speckle pattern interferometry with a holographic optical element",

abstract = "An electronic speckle pattern interferometry (ESPI) system for detection of cracks and defects is presented. In the first stage a holographic optical element (HOE) is recorded using a photopolymer material. Since the polymerisation process occurs during recording, the holograms are produced without any development/processing. In the second stage the HOE is used in an ESPI configuration for detection of cracks and defects. Due to the introduction of the HOE in the ESPI set-up, precise alignment of the optical elements is not necessary. For this reason the system is well suited for industrial applications.",

keywords = "Cracks, Defects, ESPI, Electronic speckle pattern interferometry, HOE, Holographic optical element, NDT, Photopolymer",

author = "Emilia Mihaylova and Vincent Toal and Sridhar Guntaka and Suzanne Martin",

year = "2003",

doi = "10.1117/12.519489",

language = "English",

volume = "5226",

pages = "209--213",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "12th International School on Quantum Electronics Laser Physics and Applications ; Conference date: 23-09-2002 Through 27-09-2002",

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TY - JOUR

T1 - Detection of cracks and defects using electronic speckle pattern interferometry with a holographic optical element

AU - Mihaylova, Emilia

AU - Toal, Vincent

AU - Guntaka, Sridhar

AU - Martin, Suzanne

PY - 2003

Y1 - 2003

N2 - An electronic speckle pattern interferometry (ESPI) system for detection of cracks and defects is presented. In the first stage a holographic optical element (HOE) is recorded using a photopolymer material. Since the polymerisation process occurs during recording, the holograms are produced without any development/processing. In the second stage the HOE is used in an ESPI configuration for detection of cracks and defects. Due to the introduction of the HOE in the ESPI set-up, precise alignment of the optical elements is not necessary. For this reason the system is well suited for industrial applications.

AB - An electronic speckle pattern interferometry (ESPI) system for detection of cracks and defects is presented. In the first stage a holographic optical element (HOE) is recorded using a photopolymer material. Since the polymerisation process occurs during recording, the holograms are produced without any development/processing. In the second stage the HOE is used in an ESPI configuration for detection of cracks and defects. Due to the introduction of the HOE in the ESPI set-up, precise alignment of the optical elements is not necessary. For this reason the system is well suited for industrial applications.

KW - Cracks

KW - Defects

KW - ESPI

KW - Electronic speckle pattern interferometry

KW - HOE

KW - Holographic optical element

KW - NDT

KW - Photopolymer

UR - https://www.scopus.com/pages/publications/2342582105

U2 - 10.1117/12.519489

DO - 10.1117/12.519489

M3 - Conference article

AN - SCOPUS:2342582105

SN - 0277-786X

VL - 5226

SP - 209

EP - 213

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - 12th International School on Quantum Electronics Laser Physics and Applications

Y2 - 23 September 2002 through 27 September 2002

ER -

Detection of cracks and defects using electronic speckle pattern interferometry with a holographic optical element

Abstract

Keywords

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