Degradation and device physics modeling of TiO2/CZTS ultrathin film photovoltaics

M. Houshmand, Hamid Esmaili, M. Hossein Zandi, Nima E. Gorji

Research output: Contribution to journalArticlepeer-review

25 Citations (Scopus)

Abstract

Abstract A hybrid solar cell of a nonporous n-type-TiO2nanolayer and a p-type semiconductor Cu2(Zn,Sn)Se4(CZTS) ultrathin film has been numerically simulated using SCAPS-1D program. The device physics including carrier generation, charge collection and current-voltage characteristics are investigated and the degradation rate of the electrical parameters under the normal operation condition is considered through a time dependent approach. The simulation analyzes are based on the experimental data reported in literature. An ultrathin (d≤1 μm) instead of a thin CZTS layer is considered due to high absorption coefficient of such materials which allows a sub-micron layer to be adequate for complete photoabsorption. The defect density/levels significantly reduce the efficiency over time. The results are interpreted with a device physics proposed in in literature on the tunneling recombination at the interface of such structure. The TiO2layer was selected to be 50 nm only.

Original languageEnglish
Article number18948
Pages (from-to)123-126
Number of pages4
JournalMaterials Letters
Volume157
DOIs
Publication statusPublished - 9 Jun 2015
Externally publishedYes

Keywords

  • CuZnSnS
  • Degradation
  • Device physics
  • SCAPS-1D
  • Thin film
  • TiO

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