Crystallographic Orientation Analyses of Magnetite Thin Films Using Electron Backscatter Diffraction (EBSD)

A. Koblischka-Veneva; F. Mücklich; M. R. Koblischka; S. Murphy; Y. Zhou; I. V. Shvets

doi:10.1109/TMAG.2006.880079

Crystallographic Orientation Analyses of Magnetite Thin Films Using Electron Backscatter Diffraction (EBSD)

A. Koblischka-Veneva
, F. Mücklich
, M. R. Koblischka
, S. Murphy
, Y. Zhou
, I. V. Shvets

Research output: Contribution to journal › Article › peer-review

Abstract

The crystallographic orientation of magnetite (Fe₃ 0₄) thin films was measured using electron backscatter diffraction (EBSD). Misori-entation boundaries appear in maps of angular misorientation data. The distribution of misorientation angles changes after annealing the samples in air at 250° C. Most small-angle misorientations (<5°) are removed after one minute of annealing, whereas larger misorientations (as high as 60°) continue to persist.

Original language	English
Pages (from-to)	2873-2875
Number of pages	3
Journal	IEEE Transactions on Magnetics
Volume	42
Issue number	10
DOIs	https://doi.org/10.1109/TMAG.2006.880079
Publication status	Published - Oct 2006
Externally published	Yes

Keywords

Crystal growth
electron backscatter diffraction
electron microscopy
magnetite
position measurement

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10.1109/TMAG.2006.880079

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title = "Crystallographic Orientation Analyses of Magnetite Thin Films Using Electron Backscatter Diffraction (EBSD)",

abstract = "The crystallographic orientation of magnetite (Fe3 04) thin films was measured using electron backscatter diffraction (EBSD). Misori-entation boundaries appear in maps of angular misorientation data. The distribution of misorientation angles changes after annealing the samples in air at 250° C. Most small-angle misorientations (<5°) are removed after one minute of annealing, whereas larger misorientations (as high as 60°) continue to persist.",

keywords = "Crystal growth, electron backscatter diffraction, electron microscopy, magnetite, position measurement",

author = "A. Koblischka-Veneva and F. M{\"u}cklich and Koblischka, \{M. R.\} and S. Murphy and Y. Zhou and Shvets, \{I. V.\}",

year = "2006",

month = oct,

doi = "10.1109/TMAG.2006.880079",

language = "English",

volume = "42",

pages = "2873--2875",

journal = "IEEE Transactions on Magnetics",

issn = "0018-9464",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "10",

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TY - JOUR

T1 - Crystallographic Orientation Analyses of Magnetite Thin Films Using Electron Backscatter Diffraction (EBSD)

AU - Koblischka-Veneva, A.

AU - Mücklich, F.

AU - Koblischka, M. R.

AU - Murphy, S.

AU - Zhou, Y.

AU - Shvets, I. V.

PY - 2006/10

Y1 - 2006/10

N2 - The crystallographic orientation of magnetite (Fe3 04) thin films was measured using electron backscatter diffraction (EBSD). Misori-entation boundaries appear in maps of angular misorientation data. The distribution of misorientation angles changes after annealing the samples in air at 250° C. Most small-angle misorientations (<5°) are removed after one minute of annealing, whereas larger misorientations (as high as 60°) continue to persist.

AB - The crystallographic orientation of magnetite (Fe3 04) thin films was measured using electron backscatter diffraction (EBSD). Misori-entation boundaries appear in maps of angular misorientation data. The distribution of misorientation angles changes after annealing the samples in air at 250° C. Most small-angle misorientations (<5°) are removed after one minute of annealing, whereas larger misorientations (as high as 60°) continue to persist.

KW - Crystal growth

KW - electron backscatter diffraction

KW - electron microscopy

KW - magnetite

KW - position measurement

UR - https://www.scopus.com/pages/publications/85008048138

U2 - 10.1109/TMAG.2006.880079

DO - 10.1109/TMAG.2006.880079

M3 - Article

AN - SCOPUS:85008048138

SN - 0018-9464

VL - 42

SP - 2873

EP - 2875

JO - IEEE Transactions on Magnetics

JF - IEEE Transactions on Magnetics

IS - 10

ER -

Crystallographic Orientation Analyses of Magnetite Thin Films Using Electron Backscatter Diffraction (EBSD)

Abstract

Keywords

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