Characterization of the Submicrometer Hierarchy Levels in the Twist-Bend Nematic Phase with Nanometric Helices via Photopolymerization. Explanation for the Sign Reversal in the Polar Response

Vitaly P. Panov, Sithara P. Sreenilayam, Yuri P. Panarin, Jagdish K. Vij, Chris J. Welch, Georg H. Mehl

    Research output: Contribution to journalArticlepeer-review

    26 Citations (Scopus)

    Abstract

    Photopolymerization of a reactive mesogen mixed with a mesogenic dimer, shown to exhibit the twist-bend nematic phase (NTB), reveals the complex structure of the self-deformation patterns observed in planar cells. The polymerized reactive mesogen retains the structure formed by liquid crystalline molecules in the twist bend phase, thus enabling its observation by scanning electron microscopy (SEM). Hierarchical ordering scales ranging from tens of nanometers to micrometers are imaged in detail. Submicron features, anticipated from earlier X-ray experiments, are visualized directly. In the self-deformation stripes formed in the NTB phase, the average director field is found tilted in the cell plane by an angle of up to 45° from the cell rubbing direction. This tilt explains the sign inversion being observed in the electro-optical studies.

    Original languageEnglish
    Pages (from-to)7515-7519
    Number of pages5
    JournalNano Letters
    Volume17
    Issue number12
    DOIs
    Publication statusPublished - 13 Dec 2017

    Keywords

    • Twist-bend nematic
    • hierarchical self-assembly
    • polymerization
    • scanning electron microscopy

    Fingerprint

    Dive into the research topics of 'Characterization of the Submicrometer Hierarchy Levels in the Twist-Bend Nematic Phase with Nanometric Helices via Photopolymerization. Explanation for the Sign Reversal in the Polar Response'. Together they form a unique fingerprint.

    Cite this