An interferometric linear in-plane position transducer

M. Reynolds; V. Toal

doi:10.1016/0030-3992(92)90036-2

An interferometric linear in-plane position transducer

M. Reynolds, V. Toal

Technological University Dublin

Research output: Contribution to journal › Article › peer-review

Abstract

When mutally coherent light beams overlap on an optically rough surface, the scattered light fields or speckle patterns interfere. The intensity at any point depends on the phase difference between the light fields. By matching the sensitive area of a photodetector to speckle size, an electronic signal is obtained which can be used to monitor in-plane rigid body translations of the surface with interferometric precision. Two reliable methods of obtaining directional sensitivity based on polarization properties are described and it is shown that depolarization effects due to rough surfaces, do not cause any difficulty. Intensitivity to motion orthogonal to the plane of the apparatus is demonstrated.

Original language	English
Pages (from-to)	59-65
Number of pages	7
Journal	Optics and Laser Technology
Volume	24
Issue number	2
DOIs	https://doi.org/10.1016/0030-3992(92)90036-2
Publication status	Published - Apr 1992

Keywords

direction sensitivity
interferometry
polarization
position transducers
speckle

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10.1016/0030-3992(92)90036-2

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title = "An interferometric linear in-plane position transducer",

abstract = "When mutally coherent light beams overlap on an optically rough surface, the scattered light fields or speckle patterns interfere. The intensity at any point depends on the phase difference between the light fields. By matching the sensitive area of a photodetector to speckle size, an electronic signal is obtained which can be used to monitor in-plane rigid body translations of the surface with interferometric precision. Two reliable methods of obtaining directional sensitivity based on polarization properties are described and it is shown that depolarization effects due to rough surfaces, do not cause any difficulty. Intensitivity to motion orthogonal to the plane of the apparatus is demonstrated.",

keywords = "direction sensitivity, interferometry, polarization, position transducers, speckle",

author = "M. Reynolds and V. Toal",

year = "1992",

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doi = "10.1016/0030-3992(92)90036-2",

language = "English",

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T1 - An interferometric linear in-plane position transducer

AU - Reynolds, M.

AU - Toal, V.

PY - 1992/4

Y1 - 1992/4

N2 - When mutally coherent light beams overlap on an optically rough surface, the scattered light fields or speckle patterns interfere. The intensity at any point depends on the phase difference between the light fields. By matching the sensitive area of a photodetector to speckle size, an electronic signal is obtained which can be used to monitor in-plane rigid body translations of the surface with interferometric precision. Two reliable methods of obtaining directional sensitivity based on polarization properties are described and it is shown that depolarization effects due to rough surfaces, do not cause any difficulty. Intensitivity to motion orthogonal to the plane of the apparatus is demonstrated.

AB - When mutally coherent light beams overlap on an optically rough surface, the scattered light fields or speckle patterns interfere. The intensity at any point depends on the phase difference between the light fields. By matching the sensitive area of a photodetector to speckle size, an electronic signal is obtained which can be used to monitor in-plane rigid body translations of the surface with interferometric precision. Two reliable methods of obtaining directional sensitivity based on polarization properties are described and it is shown that depolarization effects due to rough surfaces, do not cause any difficulty. Intensitivity to motion orthogonal to the plane of the apparatus is demonstrated.

KW - direction sensitivity

KW - interferometry

KW - polarization

KW - position transducers

KW - speckle

UR - https://www.scopus.com/pages/publications/0026847339

U2 - 10.1016/0030-3992(92)90036-2

DO - 10.1016/0030-3992(92)90036-2

M3 - Article

AN - SCOPUS:0026847339

SN - 0030-3992

VL - 24

SP - 59

EP - 65

JO - Optics and Laser Technology

JF - Optics and Laser Technology

IS - 2

ER -

An interferometric linear in-plane position transducer

Abstract

Keywords

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