Abstract

Applying deep learning to medical imaging, especially in haematology, faces significant challenges due to class imbalance, where infected cells are vastly outnumbered by normal cells. This study addresses this issue using a Customized Repeat Factor Sampling (CRFS) method integrated into the Faster R-CNN architecture within the Detectron2 framework, with malaria detection as a use case. By dynamically adjusting sampling weights based on the number of infected instances, CRFS significantly improves model performance. Results show notable increases in precision, recall, and F1 scores for detecting malaria-infected cells, demonstrating the method’s effectiveness in enhancing detection accuracy. This approach offers a straightforward and computationally efficient solution to class imbalance, with potential applications across various haematological disorders, improving screening processes for other rare blood conditions.

Original languageEnglish
Title of host publicationICAAI 2024 - Conference Proceedings of the 2024 8th International Conference on Advances in Artificial Intelligence
PublisherAssociation for Computing Machinery (ACM)
Pages21-27
Number of pages7
ISBN (Electronic)9798400718014
DOIs
Publication statusPublished - 3 Mar 2025
Event8th International Conference on Advances in Artificial Intelligence, ICAAI 2024 - London, United Kingdom
Duration: 17 Oct 202419 Oct 2024

Publication series

NameICAAI 2024 - Conference Proceedings of the 2024 8th International Conference on Advances in Artificial Intelligence

Conference

Conference8th International Conference on Advances in Artificial Intelligence, ICAAI 2024
Country/TerritoryUnited Kingdom
CityLondon
Period17/10/2419/10/24

Keywords

  • Class imbalance
  • Custom Repeat Factor Sampling
  • deep learning
  • Faster R-CNN
  • haematology
  • malaria detection
  • medical imaging

Fingerprint

Dive into the research topics of 'Addressing Class Imbalance Issues in Haematological Images using Repeat Factor Sampling'. Together they form a unique fingerprint.

Cite this