A ratiometric wavelength measurement based on a silicon-on-insulator directional coupler integrated device

Pengfei Wang; Agus Muhamad Hatta; Haoyu Zhao; Jie Zheng; Gerald Farrell; Gilberto Brambilla

doi:10.3390/s150921280

A ratiometric wavelength measurement based on a silicon-on-insulator directional coupler integrated device

Pengfei Wang, Agus Muhamad Hatta, Haoyu Zhao, Jie Zheng, Gerald Farrell, Gilberto Brambilla

Research output: Contribution to journal › Article › peer-review

Abstract

A ratiometric wavelength measurement based on a Silicon-on-Insulator (SOI) integrated device is proposed and designed, which consists of directional couplers acting as two edge filters with opposite spectral responses. The optimal separation distance between two parallel silicon waveguides and the interaction length of the directional coupler are designed to meet the desired spectral response by using local supermodes. The wavelength discrimination ability of the designed ratiometric structure is demonstrated by a beam propagation method numerically and then is verified experimentally. The experimental results have shown a general agreement with the theoretical models. The ratiometric wavelength system demonstrates a resolution of better than 50 pm at a wavelength around 1550 nm with ease of assembly and calibration.

Original language	English
Pages (from-to)	21280-21293
Number of pages	14
Journal	Sensors
Volume	15
Issue number	9
DOIs	https://doi.org/10.3390/s150921280
Publication status	Published - 28 Aug 2015

Keywords

Directional coupler
Integrated optics
Wavelength monitor

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title = "A ratiometric wavelength measurement based on a silicon-on-insulator directional coupler integrated device",

abstract = "A ratiometric wavelength measurement based on a Silicon-on-Insulator (SOI) integrated device is proposed and designed, which consists of directional couplers acting as two edge filters with opposite spectral responses. The optimal separation distance between two parallel silicon waveguides and the interaction length of the directional coupler are designed to meet the desired spectral response by using local supermodes. The wavelength discrimination ability of the designed ratiometric structure is demonstrated by a beam propagation method numerically and then is verified experimentally. The experimental results have shown a general agreement with the theoretical models. The ratiometric wavelength system demonstrates a resolution of better than 50 pm at a wavelength around 1550 nm with ease of assembly and calibration.",

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T1 - A ratiometric wavelength measurement based on a silicon-on-insulator directional coupler integrated device

AU - Wang, Pengfei

AU - Hatta, Agus Muhamad

AU - Zhao, Haoyu

AU - Zheng, Jie

AU - Farrell, Gerald

AU - Brambilla, Gilberto

PY - 2015/8/28

Y1 - 2015/8/28

N2 - A ratiometric wavelength measurement based on a Silicon-on-Insulator (SOI) integrated device is proposed and designed, which consists of directional couplers acting as two edge filters with opposite spectral responses. The optimal separation distance between two parallel silicon waveguides and the interaction length of the directional coupler are designed to meet the desired spectral response by using local supermodes. The wavelength discrimination ability of the designed ratiometric structure is demonstrated by a beam propagation method numerically and then is verified experimentally. The experimental results have shown a general agreement with the theoretical models. The ratiometric wavelength system demonstrates a resolution of better than 50 pm at a wavelength around 1550 nm with ease of assembly and calibration.

AB - A ratiometric wavelength measurement based on a Silicon-on-Insulator (SOI) integrated device is proposed and designed, which consists of directional couplers acting as two edge filters with opposite spectral responses. The optimal separation distance between two parallel silicon waveguides and the interaction length of the directional coupler are designed to meet the desired spectral response by using local supermodes. The wavelength discrimination ability of the designed ratiometric structure is demonstrated by a beam propagation method numerically and then is verified experimentally. The experimental results have shown a general agreement with the theoretical models. The ratiometric wavelength system demonstrates a resolution of better than 50 pm at a wavelength around 1550 nm with ease of assembly and calibration.

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KW - Integrated optics

KW - Wavelength monitor

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A ratiometric wavelength measurement based on a silicon-on-insulator directional coupler integrated device

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