Abstract
A numerical simulation has been carried out for a redox couple confined to a thin layer under potential step or cyclic voltammetric conditions where the diffusion coefficient is determined by the relative amounts of the oxidized form (of diffusion coefficient D1) and reduced form (of diffusion coefficient D2). An overall layer diffusion coefficient D is determined by the mole fractions of species 1 and 2; D(n1 + n2) = n1D1 + n2D2. This layer diffusion coefficient is proposed as an alternative model to that of interaction parameters used to characterize nonidealities during potential step and cyclic voltammetric experiments of surface confined redox species.
| Original language | English |
|---|---|
| Pages (from-to) | 139-142 |
| Number of pages | 4 |
| Journal | Electroanalysis |
| Volume | 8 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - Feb 1996 |
Keywords
- Diffusion
- Mass transport
- Thin layer