A methodology for comparing classifiers that allow the control of bias

Anton Zamolotskikh, Sarah Jane Delany, Pádraig Cunningham

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper presents False Positive-Critical Classifiers Comparison a new technique for pairwise comparison of classifiers that allow the control of bias. An evaluation of Naïve Bayes, k-Nearest Neighbour and Support Vector Machine classifiers has been carried out on five datasets containing unsolicited and legitimate e-mail messages to confirm the advantage of the technique over Receiver Operating Characteristic curves. The evaluation results suggest that the technique may be useful for choosing the better classifier when the ROC curves do not show comprehensive differences, as well as to prove that the difference between two classifiers is not significant, when ROC suggests that it might be. Spam filtering is a typical application for such a comparison tool, as it requires a classifier to be biased toward negative prediction and to have some upper limit on the rate of false positives. Finally the particular evaluation summary is presented, which confirms that Support Vector Machines outperform other methods in most cases, while the Naïve Bayes classifier works well in a narrow, but relevant range of false positive rate.

Original languageEnglish
Title of host publicationApplied Computing 2006 - The 21st Annual ACM Symposium on Applied Computing - Proceedings of the 2006 ACM Symposium on Applied Computing
PublisherAssociation for Computing Machinery
Pages582-587
Number of pages6
ISBN (Print)1595931082, 9781595931085
DOIs
Publication statusPublished - 2006
Event2006 ACM Symposium on Applied Computing - Dijon, France
Duration: 23 Apr 200627 Apr 2006

Publication series

NameProceedings of the ACM Symposium on Applied Computing
Volume1

Conference

Conference2006 ACM Symposium on Applied Computing
Country/TerritoryFrance
CityDijon
Period23/04/0627/04/06

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