TY - GEN
T1 - A comparison of metal adhesion layers for Au films in thermo-plasmonic applications
AU - Abbott, William M.
AU - Murray, Christopher P.
AU - Lochlainn, Sorcha Ní
AU - Bello, Frank
AU - Zhong, Chuan
AU - Smith, Christopher
AU - Petford-Long, Amanda K.
AU - Donegan, John F.
AU - McCloskey, David
N1 - Publisher Copyright:
© 2019 The Author (s)
PY - 2019
Y1 - 2019
N2 - The dewetting resistance of Au 50 nm films fabricated atop Ti/Ta/W/Cr/Al adhesion layers (0.5-5 nm) was investigated. Results show sub-nanometer Ta has superior stability under thermal stress, while W & Ti show best plasmonic response.
AB - The dewetting resistance of Au 50 nm films fabricated atop Ti/Ta/W/Cr/Al adhesion layers (0.5-5 nm) was investigated. Results show sub-nanometer Ta has superior stability under thermal stress, while W & Ti show best plasmonic response.
UR - https://www.scopus.com/pages/publications/85068119686
U2 - 10.1364/CLEO_AT.2019.JW2A.66
DO - 10.1364/CLEO_AT.2019.JW2A.66
M3 - Conference contribution
AN - SCOPUS:85068119686
SN - 9781943580576
T3 - Optics InfoBase Conference Papers
BT - CLEO
PB - Optica Publishing Group (formerly OSA)
T2 - CLEO: Applications and Technology, CLEO_AT 2019
Y2 - 5 May 2019 through 10 May 2019
ER -