Research output per year
Research output per year
Personal profile
Research Interests
Artificial Intelligence
Education/Academic qualification
PhD
Award Date: 1 Jan 2008
Bachelor, B.A. Mod HONS in Computer Science, Trinity College Dublin
Award Date: 31 May 2003
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Dive into the research topics where Steven Davy is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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Application Adaptive Light-Weight Deep Learning (AppAdapt-LWDL) Framework for Enabling Edge Intelligence in Dairy Processing
Mhapsekar, R. U., Abraham, L., Davy, S. & Dey, I., 2025, In: IEEE Transactions on Mobile Computing. 24, 2, p. 1105-1119 15 p.Research output: Contribution to journal › Article › peer-review
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AI and 6G Into the Metaverse: Fundamentals, Challenges and Future Research Trends
Zawish, M., Dharejo, F. A., Khowaja, S. A., Raza, S., Davy, S., Dev, K. & Bellavista, P., 2024, In: IEEE Open Journal of the Communications Society. 5, p. 730-778 49 p.Research output: Contribution to journal › Article › peer-review
Open Access -
An Edge-Centric Industrial IoT Solution for Smart Dairy Processing
Mhapsekar, R. U., O'Shea, N., Davy, S., Kilbane, D. & Abraham, L., 2024, In: IEEE Internet of Things Magazine. 7, 5, p. 80-87 8 p.Research output: Contribution to journal › Article › peer-review
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Complexity-Driven Model Compression for Resource-constrained Deep Learning on Edge
Zawish, M., Davy, S. & Abraham, L., 2024, In: IEEE Transactions on Artificial Intelligence. 5, 8, p. 3886-3901 16 p.Research output: Contribution to journal › Article › peer-review
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Energy-Efficient Uncertainty-Aware Biomass Composition Prediction at the Edge
Zawish, M., Albert, P., Esposito, F., Davy, S. & Abraham, L., 2024, Proceedings - 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024. IEEE Computer Society, p. 5357-5365 9 p. (IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review