X-Sight M5 2D Digital Image Correlation (DIC) System

The X-Sight M5 2D DIC system is a non-contact optical tool that measures and visualizes the full-field deformation and strain on a specimen's surface during mechanical testing. By analyzing images of a speckled surface and comparing how the speckle pattern changes over time, the system provides detailed, precise, and real-time data on how materials and structures distort under load, which is used for validating designs and simulations.