SEM/EDX

SEM/EDX provides both high-resolution surface images and elemental composition information of a sample, allowing for the identification of material defects, contamination, and the precise composition of materials. The Scanning Electron Microscope (SEM) generates detailed images of a sample's surface structure, while the Energy Dispersive X-ray Spectroscopy (EDX) detector analyzes the X-rays emitted when the electron beam interacts with the sample's atoms, revealing the types and amounts of elements present.