SEM Phenom XL

A Scanning Electron Microscope (SEM) generates high-resolution images of a sample's surface topography and morphology, and can perform elemental microanalysis to identify the chemical composition of materials. By using an electron beam to scan a sample, it produces magnified images and provides data on characteristics like size, shape, and composition, making it a powerful tool for research, quality control, and failure analysis in various industries like pharmaceuticals and materials science