Equipments Details
Description
The Filmetrics F20 UVX measures the thickness and optical constants (refractive index) of transparent thin films using spectroscopic reflectometry. It analyzes interference patterns in reflected light within the UV-Visible spectrum (380-1050 nm for the standard F20, extending to lower UV for the UVX model) to calculate the film's properties, providing fast, non-contact measurements for applications in semiconductors, optics, and displays.
Details
| Name | TUD_LABCUP_AS587 |
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