Horiba Jobin Yvon Xplora LHS (Raman)

The HORIBA Jobin Yvon Xplora is a high-performance, versatile Raman microscope system that performs non-destructive chemical and structural analysis of microscopic samples. It does this by coupling a Raman spectrometer with a microscope, allowing it to identify chemical composition, structure, crystallinity, and strain at a microscopic level, even generating detailed chemical maps. The Xplora system is used across various fields, including materials science, nanotechnology, and biology, and can be integrated with other techniques like Atomic Force Microscopy (AFM) and Tip-Enhanced Raman Spectroscopy (TERS) for ultra-high spatial resolution.