AFM

A portable atomic force microscope (AFM) allows researchers to perform ultra-high-resolution imaging and mechanical characterization of surfaces on the nanoscale, even outside of a traditional laboratory setting, by using a sharp tip to scan a surface line-by-line, mapping its three-dimensional topography and other properties. Unlike stationary AFMs, portable versions are compact, often require minimal or no air or electricity, and are housed in durable cases, making them easy to transport for fieldwork, educational purposes, or quick characterization of various materials like polymers, biomaterials, and microelectronics.